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To support the emerging field of nanophotonics, experimental techniques which can characterise optical properties on this length scale are required. Toon Coenen presents a novel experimental nanoscopy technique that can be used as a nanoscale characterisation tool for optical properties, namely: Angle-Resolved Cathodoluminescence (CL0 Imaging Spectroscopy (ARCIS). This technique combines electron microscopy with optical microscopy, giving it an excitation resolution greatly exceeding that of optical microscopy, while retaining optical sensitivity.

Event details of New technique measures optical properties on nanoscale
Date 15 May 2014
Time 10:00 -11:00
Location Agnietenkapel

T. Coenen, Angle-Resolved Cathodoluminescence Nanoscopy.

Supervisor

Prof. A. Polman

Agnietenkapel

Oudezijds Voorburgwal 229 - 231
1012 EZ Amsterdam

Entrance

This event is open to the public.