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In industry, binary measurement systems are used in quality control, to test whether products conform to certain specifications, on the basis of which they are either accepted or rejected. Measurement errors do occur, however, which means the customer receives a defective product or unnecessary scrap or rework is carried out. That is why, when using binary measurement systems, it is important to have some quantification of its reliability in terms of measurement errors. In his research, Thomas Akkerhuis focuses on evaluating such systems in situations in which there is no available 'gold standard', i.e. no generally accepted authoritative measurement procedure.

Event details of Measurement system analysis for binary tests
Date 16 September 2016
Time 16:00 -17:00
Location Agnietenkapel
Room Location

T.S. Akkerhuis: Measurement System Analysis for Binary Tests.

Supervisors

Prof. J. de Mast

Prof. M.R.H. Mandjes

Agnietenkapel

Room Location

Oudezijds Voorburgwal 229 - 231
1012 EZ Amsterdam

Entrance

This event is open to the public.