For best experience please turn on javascript and use a modern browser!
You are using a browser that is no longer supported by Microsoft. Please upgrade your browser. The site may not present itself correctly if you continue browsing.
Bekijk de site in het Nederlands

In industry, binary measurement systems are used in quality control, to test whether products conform to certain specifications, on the basis of which they are either accepted or rejected. Measurement errors do occur, however, which means the customer receives a defective product or unnecessary scrap or rework is carried out. That is why, when using binary measurement systems, it is important to have some quantification of its reliability in terms of measurement errors. In his research, Thomas Akkerhuis focuses on evaluating such systems in situations in which there is no available 'gold standard', i.e. no generally accepted authoritative measurement procedure.

Event details of Measurement system analysis for binary tests
Date 16 September 2016
Time 16:00 -17:00
Location Agnietenkapel
Room Location

T.S. Akkerhuis: Measurement System Analysis for Binary Tests.


Prof. J. de Mast

Prof. M.R.H. Mandjes


Room Location

Oudezijds Voorburgwal 229 - 231
1012 EZ Amsterdam


This event is open to the public.